Helmutfischer – X-Ray XRF – FISCHERSCOPE
A FISCHERSCOPE X-RAY is the ideal choice for non-destructive, contact-free coating thickness measurement and material analysis. Since 1983, our XRF instruments have been an integral part of quality testing in almost all major industries. Our instruments are well-known for their precision, accuracy and durability. At the same time FISCHERSCOPE X-RAYs are designed to be user-friendly and to support you in all aspects of measuring. This enables you to focus on the quality job at hand and not on the measuring instrument.
Our XRFs come with Fischer WinFTM software which is designed to facilitate the measurement process. This includes controlling the X-RAY, enabling traceability of measurements, generating personalized measurement reports and interfacing with internal networks.
That is why our product is well-suited for industries that require stringent quality control measures, such as electronics, electroplating, automotive, gold, jewelry, etc.
Key Features
- Extended statistic functions
- Image recognition
- Distance Controlled Measurement (DCM)
- Just one software for XRF coating thickness measurement and material analysis
Available Models
The instruments of the FISCHERSCOPE® X-RAY XUL® and XULM® series are the right solution for fast coating thickness determination in electroplating. There, a large number of samples must pass through quality control as efficiently as possible. For this reason, the XUL series is designed to enable bulky samples to be positioned man- ually in the measuring chamber. There is also the option of a manual XY stage, facilitating the exact alignment of small parts. An intuitive control panel on the front of the unit further simplifies handling.
Key Features
- Robust entry-level instrument for coating thickness measurement and determination of metal content in electroplating baths
- XUL® set-up with bottom up measuring direction
- Standard X-ray tube (XUL®) or microfocus tube (XULM®)
- 4-fold changeable apertures (XULM®)
- 3-fold changeable filter (XULM®)
- Proportional counter tube detector for short measuring times, particularly large measuring distances and complex geometries
- Up to 17 cm sample height possible
- Fully protected instrument with type approval ac- cording to current radiation protection legislation
The XAN® 215 with a powerful PIN detector is suitable for analyzing simple gold alloys that contain only a few other elements such as silver and copper. For more complex alloys, instruments with a silicon drift detector (e. g. XAN® 220) are a better choice. With their much higher resolution, they can distinguish between gold and platinum, for example in the analysis of dental alloys and melted precious metal alloys.
RoHS screening also requires higher resolutions as well as different primary filters. Ideal for this: XAN® 250 with fixed sample support or the XAN® 252 with manually operated XY stage.
Key Features
- Universal instrument for metal and precious metal analysis, coating thickness measurement on simple-shaped samples and RoHS screening
- XAN form factor with measuring bottom up
- Microfocus tube with tungsten anode
- 4-fold changeable apertures (XAN® 250, 252)
- 6-fold changeable filter (XAN® 250, 252)
- Various semiconductor detectors ensure very gooddetection accuracy and high resolution: silicon PIN and silicon drift detector
- DPP+ digital pulse processor for higher count rates and significantly reduced measuring times
With the GOLDSCOPE SD® family, Fischer offers tailored solutions for the non-destructive testing of gold and pre- cious metals. All GOLDSCOPE SD® models are equipped with the WinFTM® software, which has the most impor- tant measuring tasks for the testing of gold and precious metals.
The GOLDSCOPE SD® family offers the right solution for your testing needs: Entry-level instruments with silicon PIN detectors are intended for use in stores and pawn- shops to check the composition of jewelry and dental gold. The GOLDSCOPE SD® 510 model is particularly space-saving: the laptop can be easily placed on top of the device.
Key Features
- Compact and robust benchtop instrument for fast, cost-effective and non-destructive analysis of jewelry, coins and precious metals
- Hardware and software aligned to measuring tasks related to gold and precious metals
- Especially space-saving with the GOLDSCOPE SD® 510 version
- Measuring direction with measuring bottom up
- 4-fold changeable apertures (GOLDSCOPE SD® 5
GOLDSCOPE SD® 600
The GOLDSCOPE SD® 600 is tailor-made for non-destruc- tive gold and jewelry testing as well as precious metal analysis. Predefined measurement tasks (gold setup) simplify the application for you. The silicon drift detector ensures high-resolution analyses of alloys and layers such as gold on sterling silver or rhodium on gold alloys.
Key Features
- Robust benchtop instrument for analysis of jewelry, coins and precious metals
- Measuring direction with measuring top down
- Microfocus tube with tungsten anode
FISCHERSCOPE® X-RAY XDAL® 600
The FISCHERSCOPE® X-RAY XDAL® 600 is designed for non-destructive measurement of very thin layers and material analysis. This instrument is characterized by its compact design, simple handling and operation with a silicon drift detector that allows for the highest perfor- mance.
Key Features
- Universal instrument for measurement on smallest structures, very thin multilayers, functional layers, and very thin coating ≤ 0.1 μm
- Measuring direction with measuring top down
- Microfocus tube with tungsten anode
FISCHERSCOPE® X-RAY XDV®-SDD models are among the most powerful X-ray instruments. Their silicon drift detector is extremely sensitive to fluorescence radiation of light elements. This permits very low detection limits as well as measurement applications relating to NiP, RoHS and very thin layers < 0.05 μm. This is why the uni- versal XDV®-SDD instrument performs exceedingly well in research and development, laboratory and process qualification settings. Also, its ease of use makes it indis- pensable in production control.
Key Features
- 4-fold changeable apertures
- 6-fold changeable filter
- Silicon drift detector 50 mm2 for highest precision on thin layers
- Aperture (collimator) up to 3 mm: Highest intensity for shortest measuring time even with difficult sam- ples (thinnest coatings, Si wafers, conversion layers), light elements (fuel cells, Al components)
- Programmable measuring stage for automated measurements on small structures
- Fully protected instrument with type approval according to current radiation protection legislation
The FISCHERSCOPE® X-RAY XDV®-μ instruments form Fischer’s high-end X-ray fluorescence series, designed for precise coating thickness measurement and ma- terial analysis on tiny structures. The instruments are equipped with powerful silicon drift detectors and polycapillary optics, which drastically reduce measuring times and enable repeatable measurements due to the high radiation intensity.
Key Features
- Polycapillary optics permit particularly small measurement spots of 60 μm FWHM at short measuring times with high intensity
- Silicon drift detector 20 or 50 mm2 for highest precision on thin layers
- Video system with 3x optical zoom for precise sample positioning
- Precise programmable measuring table for automat- ed measurements on small structures
Brand
Fischer is a leading specialist in material analysis, coating thickness measurement and material testing since 1953. We offer a wide range of measuring devices for different industries: from simple handheld devices for quick testing on the go to fully integrated, high-end systems that automatically monitor your production.
In the 1980s and 90s, Fischer greatly expanded its product range. In addition to a hardness tester, the first X-ray fluorescence (XRF) instrument was launched in 1981. Numerous patented innovations helped the devices to quickly establish themselves in industrial use – because customers appreciate the reliability and measuring precision of Fischer instruments.
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