The specialist for field duty and much more.

The FISCHERSCOPE® X-RAY XAN® 500 is the most versatile X-ray fluorescence (XRF) system available. As a handheld XRF analyzer, it’s perfect for inspecting coatings on bulky items like airplane parts, pipes or turbine blades in a running production line.

In contrast to other portable XRF devices on the market, the FISCHERSCOPE XAN 500 determines coating thickness very precisely. Its 3-point support makes it easy to place correctly and keeps it stable during the entire measurement. A high-quality silicon drift detector (SDD) ensures the precision needed to analyze alloy layers such as zinc-nickel.

Your Entry to the World of Automated XRF-Measurement

The FISCHERSCOPE® X-RAY XDL® and XDLM® X-ray fluorescence (XRF) spectrometers are closely related to the XUL series. All the main components – such as the detector, X-ray tubes and filter combinations – are identical. But there is a significant difference: The XDL and XDLM devices measure from top to bottom. And that means convenient XRF analysis of non-flat samples – complex shapes are no longer a problem!

We have developed the FISCHERSCOPE® X-RAY XDV®-µ especially for measuring smallest structures and components with short measuring times. A large-area silicon drift detector and the polycapillary optics enable precise, repeatable measurements e.g. on bond surfaces, SMD components or thin wires. That permits precise quality monitoring of the coatings on printed circuit boards – and ensures their long-term function.

The FISCHERSCOPE® X-RAY XDV®-µ LD is your XRF instrument for the measurement of bulky samples. Due to the measuring distance of 12 mm, even assembled PCBs can be measured without any problems.

• Microfocus tube with tungsten anode; molybdenum anode optionally available
• Flexible, 4-fold exchangeable primary filter
• Polycapillary optics for particularly small measuring spots (10 – 60 µm FWHM) with short measuring times
• Silicon drift detector
• Video system with 3× optical zoom for precise sample positioning
• Precise, programmable measuring stage for automated measurements

The Universal Thickness Gauge for Industrial Coating Thickness Measurement

One coating thickness measuring device – diverse applications! The MMS® Inspection DFT is the all-rounder in the field of coating thickness measurement. Ideally suited for coating thickness measurement on both steel and non-ferrous metals, it finds application in a variety of industries. But here’s something special in a coating thickness gage: it’s protected against dust and water jets by an IP65-rated housing. Even under harsh conditions like in heavy corrosion protection, the dry film thickness gauge makes measuring is easy.

A FISCHERSCOPE X-RAY is the ideal choice for non-destructive, contact-free coating thickness measurement and material analysis. Since 1983, our XRF instruments have been an integral part of quality testing in almost all major industries. Our instruments are well-known for their precision, accuracy and durability. At the same time FISCHERSCOPE X-RAYs are designed to be user-friendly and to support you in all aspects of measuring. This enables you to focus on the quality job at hand and not on the measuring instrument.

Our XRFs come with Fischer WinFTM software which is designed to facilitate the measurement process. This includes controlling the X-RAY, enabling traceability of measurements, generating personalized measurement reports and interfacing with internal networks.

That is why our product is well-suited for industries that require stringent quality control measures, such as electronics, electroplating, automotive, gold, jewelry, etc.